NI SCXI-1140 | 32-Channel Relay Module | Obsolete Test & Measurement Spare Parts Risk

  • Model: SCXI-1140
  • Brand: National Instruments (NI), now part of Emerson (as of 2023 acquisition)
  • Core Function: 32-channel electromechanical relay module for signal switching in SCXI (Signal Conditioning eXtensions for Instrumentation) systems
  • Lifecycle Status: Obsolete – officially discontinued by NI; no new production since ~2018–2020
  • Procurement Risk: High – available only via surplus or third-party resellers; units often untested, with worn relays or outdated firmware
  • Critical Role: Routes analog, digital, or power signals in automated test, data acquisition, and functional validation systems; failure causes open/short circuits, signal misrouting, or test aborts
Category: SKU: NI SCXI-1140

Description

Technical Specifications (For Spare Parts Verification)

  • Model: SCXI-1140
  • Manufacturer: National Instruments
  • Platform: SCXI modular chassis (e.g., SCXI-1000, SCXI-1001)
  • Channels: 32 independent SPST (Single-Pole Single-Throw) electromechanical relays
  • Switching Capacity:
    • Voltage: Up to 60 VDC / 30 VAC (rms)
    • Current: Up to 1 A per channel (resistive load)
    • Power: Max 60 W per channel
  • Contact Material: Ruthenium-coated (low-level signal compatible)
  • Relay Type: Latching or non-latching variants (depends on sub-model; standard SCXI-1140 is non-latching)
  • Isolation: 300 V channel-to-channel and channel-to-chassis
  • Actuation Time: ~5 ms typical
  • Expected Mechanical Life: 10⁷ operations (at rated load); significantly less under frequent switching
  • Connectors: Two 37-pin D-sub (VHDCI-style) front-panel I/O connectors
  • Control Interface: Backplane communication via SCXI bus to host controller (e.g., PXI, PCI, or USB via SCXI-1600)
  • Software Support: Originally supported in LabVIEW, Measurement & Automation Explorer (MAX), and NI-DAQmx

System Role and Downtime Impact

The SCXI-1140 was widely deployed in automated test equipment (ATE) for aerospace, automotive, and electronics manufacturing—used to switch sensor excitation, route signals to DAQ devices, or simulate fault conditions. In a battery tester, for example, it might connect individual cells to a load bank; in an avionics bench, it could inject test signals into multiple LRUs (Line Replaceable Units).

A failed relay can cause:

  • Open circuit: Missing measurement → false pass/fail result
  • Stuck-closed relay: Cross-talk or short circuit → damaged UUT (Unit Under Test)
  • Intermittent contact: Unrepeatable test results → costly requalification

Because SCXI systems are often embedded in custom test sequences with years of validation, replacing the SCXI-1140 isn’t trivial—firmware revisions, relay timing, and pinout must match exactly to avoid software rework.

Reliability Analysis and Common Failure Modes

Despite robust design, the SCXI-1140 suffers from predictable wear due to its electromechanical nature:

  1. Relay contact wear or welding – especially when switching inductive loads or operating near current limits; leads to stuck-open or stuck-closed states.
  2. Coil driver failure – internal transistor or PCB trace degradation prevents relay actuation.
  3. Connector fatigue – repeated cable mating causes bent pins or high contact resistance.
  4. Contamination – dust or flux residue increases contact resistance, particularly in low-voltage signal applications (<100 mV).

Notably, the module provides no built-in relay health diagnostics. Users typically discover failures only during system self-test or inconsistent measurements.

Preventive maintenance best practices:

  • Log relay operation counts (if software supports it) and replace modules proactively at 50–70% of rated life
  • Perform continuity and isolation checks during scheduled downtime
  • Avoid switching inductive loads without external snubbers
  • Keep spare modules powered periodically to prevent contact oxidation
NI SCXI-1140

NI SCXI-1140

Lifecycle Status and Migration Strategy

NI officially discontinued the SCXI platform in favor of PXI/PXIe and CompactDAQ. The SCXI-1140 is no longer available through NI or authorized distributors. While NI offered extended support until ~2022, even repair services have ceased.

Short-term mitigation:

  • Source tested units from reputable legacy test equipment suppliers (verify relay count and calibration)
  • Implement system-level self-tests that verify all 32 channels before critical runs
  • Maintain a “golden” backup module for emergency swaps

Long-term migration paths:

  1. PXI Relay Modules:
    • NI PXI-2532B (high-density matrix) or PXI-2527 (multiplexer)
    • Requires PXI chassis and updated LabVIEW/DAQmx code
  2. CompactDAQ + Relay Modules:
    • NI 9485 (8-channel SPST relay) – lower density but modern USB/Ethernet interface
    • Scalable but may require multiple modules to match 32-channel capacity
  3. Third-Party LXI Switches:
    • Keysight, Pickering Interfaces, or Tektronix offer Ethernet-controlled relay matrices with SCPI command compatibility

Migration considerations:

  • Revalidate all test sequences for timing differences (PXI relays are often faster)
  • Update safety interlocks if switching higher-power signals
  • Archive original SCXI configuration files for regulatory traceability

 

Final Recommendation

The SCXI-1140 remains functional in many labs, but its obsolescence poses growing operational and compliance risks—especially in ISO 17025 or AS9100 environments where equipment traceability is mandatory. Organizations should:
✅ Audit all SCXI-1140 installations
✅ Prioritize replacement in high-utilization or safety-critical test stations
✅ Begin pilot migration to PXI or CompactDAQ within 12–18 months

Delaying action risks unplanned downtime, data integrity issues, or inability to certify products—making proactive lifecycle management essential.